The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance degradation. The systems were designed from inception to include RF stimulus – it was not added as an after-thought. This turnkey test system includes fully integrated software and hardware used to control a number of independently controlled test positions. Precise measurement and monitoring of test devices can be fully automated with the industry-standard LifeTest software. Various frequency ranges, power levels, and modulation types are supported.
Different channel capacities supported, including up to 16 independently controlled channels in a 2-bay rack
Utilizes innovative test fixtures that operate up to mmWave frequencies and up to 300°C device baseplate temperature while supporting over two dozen commercially available package types
High RF drive level capability (up to 50W per channel)
Range of DC bias supply options, from high resolution/low power supplies for small devices (GaAs HBT, SiGe) to 400W per channel for high power RF devices (GaN, LDMOS)
Various modulation types supported for application-specific testing (pulsed DC/RF, WCDMA)
Supports integration of external characterization instruments, such as Semiconductor Parameter Analyzers